Germanium-bulk resistance thermometers
The Ge thermometers are made from heavy doped and compensated bulk Ge. Doping is carried out using a set of impurities with various activation energies by the metallurgical method. These thermometers cover the temperature range for operation from 0.3 to 300 K.
Characteristics of Ge-bulk thermometers
Temperature dependencies of resistance and sensitivity S=dR/dT for the different types of the Ge-bulk thermometers

Cylindrical canister package (CP model):- 1.8 mm in diameter and 3.0 mm long
Effect of magnetic field on thermometers
Depending on the magnetic field value and temperature, the
magneto-resistance for different types of thermometers can be positive or negative.
The presence of magneto-resistance effect results in an error of temperature
determination. Such an error can be presented as the ratio
DT/T (%), where
DT
= T(B) - T, T is a temperature measured at B = 0, and T(B) is
some temperature measured in the magnetic field B.
Typical temperature errors,
DT/T (%), as function of magnetic
field , B (Tesla), and temperature, T (K), for Ge-bulk thermometers
of G-4/273 model
| Type of thermometer |
Temperature (K) |
2.5 (Tesla) |
4 (Tesla) |
6 (Tesla) |
8 (Tesla) |
14 (Tesla) |
Germanium-bulk thermometer G-4/273 |
4.2 |
0.2 |
-0.03 |
-0.8 |
-1.9 |
-13.3 |
L I T E R A T U R E
  - L.I. Zarubin, I.Y. Nemish, A. Szmyrka-Grzebyk, Germanium resistance
thermometers with low magnetoresistance, Cryogenics, 30 (1990)
533-538.
  - M. Besley, A. Szmyrka-Grzebyk, Stability studies on Kiev cryogenic germanium
resistance thermometers, Rev. Sci. Instrum., 61(4), (1990) 1303.
  - F. Pavese, P.P.M. Steur, D. Ferri, D. Giraudi, Wang Li, L.I. Zarubin, I.Y. Nemish, Magnetoresistance
of Kiev cryogenic doped germanium thermometers up to 6 T, Cryogenics, 30
(1990) 437-441.
   
V.F.Mitin, P.C.McDonald, F.Pavese, N.S.Boltovets, V.V.Kholevchuk, I.Yu.Nemish, V.V.Basanets, V.K.Dugaev, P.V.Sorokin, E.F.Venger, E.V.Mitin. New temperature and magnetic field sensors for cryogenic applications developed under a European Project. ICEC 20, 11-14 May 2004, Beijing, China, pp.971-974. (Zhang, Liang (EDT) /Lin, Liangzhen (EDT) /Chen, Guobang (EDT) /Publisher: Elsevier Science Ltd Published 2006/03, ISBN:0080445594 (Hard cover book).
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